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Title: Quality prediction of microchip encapulation using optimal neural networks
Authors: Tong, KW
Kwong, CK 
Yu, KM 
Issue Date: 2002
Source: In AJ Subic, HC Tsang, CY Tang & G Netherwood (Eds.), The 3rd International Conference on Quality and Reliability, Melbourne, 28-30 Aug. 2002, p. 345-350 How to cite?
Appears in Collections:Conference Paper

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