Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/57410
Title: Thickness dependence on the coercive field in ferroelectric thin films
Authors: Li, KT
Lo, VC
Issue Date: 2003
Source: The 5th International Meeting of Pacific Rim Ceramic Societies Incorporating the 16th Fall Meeting of the Ceramic Society of Japan, Nagoya, Japan, 29 September 2003 - 2 October 2003, p. 112 How to cite?
URI: http://hdl.handle.net/10397/57410
Appears in Collections:Conference Paper

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