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http://hdl.handle.net/10397/57362
Title: | The influence of ultra-precision machined patterns on self-cleaning properties | Authors: | Cheng, CT To, S Chan, CY Cheung, CF Lee, WB |
Issue Date: | 2010 | Source: | 2nd International Conference on Nanomanufacturing, 1st CIRP Conference on Nanomanufacturing, Tianjin, China, 24-26 Sep 2010, paper no. 231 (CD) How to cite? | URI: | http://hdl.handle.net/10397/57362 |
Appears in Collections: | Conference Paper |
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