Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/571
Title: Investigation of the trap states in quenched and annealed nylon 6 films using thermally stimulated depolarization current
Authors: Zhu, J
Zhang, XY
Dai, JB
Chan, HLW 
Keywords: Crystal structure
Crystalline materials
Dielectric relaxation
Electron traps
Fourier transform infrared spectroscopy
Nylon polymers
Phase transitions
Quenching
Thermal effects
X ray diffraction analysis
Issue Date: 2002
Publisher: IEEE
Source: 11th International Symposium on Electrets (ISE 11) : 1-3 October, 2002, Glen Waverley, Melbourne, Australia : proceedings, p. 126-129 How to cite?
Abstract: Quenched and annealed nylon 6 films were prepared and their short-circuit thermally stimulated depolarization current (TSDC) has been measured using a modified thermal electric analyzer. The space charge peak in the temperature range of 90°C∼180°C observed in the TSDC spectra of different samples showed that the trap state of the films shifted to lower temperature as annealing time increased. In general, the trap state became shallower in the annealed sample. The result was consistent with the structural transition of quenched β form to annealed α form. FTIR spectrum and X-ray diffraction were also used to examine the transition. According to the analysis of the phase transition, structural origin of the TSDC peaks has been proposed.
URI: http://hdl.handle.net/10397/571
ISBN: 0-7803-7560-2
Rights: © 2002 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
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