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Title: A reliability model for multi-state networks with link-capacities of production line
Authors: Liu, Y
Ip, WH 
Yung, KL 
Zhang, Y
Wang, D
Issue Date: 2003
Source: International IEE Conference on the Business of Electronic Product Reliability and Liability, January 2003, City University of Hong Kong, Hong Kong, p. 80-84 How to cite?
Appears in Collections:Conference Paper

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