Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/56014
Title: A framework of a surface feature pattern analysis method for form characterization of ultra-precision freeform surfaces
Authors: Ren, MJ
Cheung, CF 
Kong, LB
Issue Date: 2010
Source: Proceedings of The 2nd International Conference on Nanomanufacturing (nanoMan 2010), 1st CIRP Conference on Nanomanufacturing, Tianjin, China, Sept 24-26 2010, paper 338 (CD) How to cite?
URI: http://hdl.handle.net/10397/56014
Appears in Collections:Conference Paper

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