Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/55830
Title: Advance in the analysis models for characterizing multi-layered interdigital capacitors
Authors: Mak, KW
Hao, JH 
Keywords: Device modeling
Interdigital capacitors
Conformal mapping
Ferroelectric devices
Issue Date: 2014
Publisher: Cosmos Scholars Publishing House
Source: International journal of advanced applied physics research, 2014, v. 1, no. 1, p. 1-8 How to cite?
Journal: International journal of advanced applied physics research 
Abstract: The performances of multi-layered interdigital capacitors are commonly simulated by computer software. However, it is the time-consuming process. Besides simulations, the analytic models with closed form expressions provide convenient methods in particular usages, such as characterizing ferroelectric materials. This article briefly reviews the development in the expressions for analytic models. We provide an overview of partial capacitance technique and conformal mapping technique, which are used for formulating expressions. In addition, three common models used these techniques are presented. The differences of models and applications are also discussed.
URI: http://hdl.handle.net/10397/55830
ISSN: 2408-977X
DOI: 10.15379/2408-977X.2014.01.01.1
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