Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/52563
Title: Investigation of hot-electron degradation in GaN LEDs
Authors: Surya, C 
Issue Date: 2010
Source: 11th National MOCVD Conference (MOCVD' 2010), Suyuan, China, January 2010 (CD) How to cite?
URI: http://hdl.handle.net/10397/52563
Appears in Collections:Conference Paper

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