Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/52193
Title: Counterfeit proneness : conceptualization and scale development
Authors: Sharma, P
Chan, RYK 
Issue Date: 2009
Source: Oxford Business & Economics Conference, Oxford, United Kingdom, 24-26 June 2009 How to cite?
URI: http://hdl.handle.net/10397/52193
Appears in Collections:Conference Paper

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