Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/5191
Title: Size estimation of cloud migration projects with cloud migration point (CMP)
Authors: Tran, VTK
Lee, K
Fekete, A
Liu, A
Keung, J
Keywords: Size measures
Cloud computing
Migration
Theoretical validation
Empirical validation
Effort estimation
Issue Date: 23-Sep-2011
Publisher: IEEE Computer Society
Source: Proceedings - 2011 Fifth International Symposium on Empirical Software Engineering and Measurement, ESEM 2011, 19-23 September 2011, Banff, Alberta, Canada, p. 265-274 How to cite?
Abstract: One major obstacle to enterprise adoption of cloud technologies has been the lack of visibility into migration effort and cost. In this paper, we present a methodology, called Cloud Migration Point (CMP), for estimating the size of cloud migration projects, by recasting a well-known software size estimation model called Function Point (FP) into the context of cloud migration. We empirically evaluate our CMP model by performing a cross-validation on six different small-scale cloud migration projects and show that our size estimation model can be used as a reliable predictor for effort estimation. Furthermore, we prove that our CMP model satisfies the fundamental properties of a software size measure.
URI: http://hdl.handle.net/10397/5191
ISBN: 978-0-7695-4604-9
DOI: 10.1109/ESEM.2011.35
Rights: ©2011 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
The following publication Tran, V. T. K., Lee, K., Fekete, A., Liu, A., & Keung, J. (2011). Size estimation of cloud migration projects with cloud migration point (CMP). Paper presented at the Proceedings - 2011 5th International Symposium on Empirical Software Engineering and Measurement, ESEM 2011, 265-274 is available at http://dx.doi.org/10.1109/ESEM.2011.35
Appears in Collections:Conference Paper

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