Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/51461
Title: Detection of stochastic high impedance faults – a method based on wavelet transform
Authors: Lai, T
Snider, LA
Lo, EWC 
Issue Date: 2003
Source: International Conference on Electrial Engineering 2003, Hong Kong, 6-10 July 2003 (CD-ROM) How to cite?
URI: http://hdl.handle.net/10397/51461
Appears in Collections:Conference Paper

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