Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/51031
Title: Microstructural and magnetic characterization of ion-beam bombarded [Ni80Fe20-cr]50 thin films
Authors: Zheng, C
Lin, KW
Liu, CH
Leung, CW 
Chen, YH
Wu, TH
Desautels, RD
Lierop, JV
Pong, PWT
Issue Date: 2014
Source: The 3rd International Symposium on Next-Generation Electronics (ISNE 2014), Taoyuan, Taiwan, 7-10 May 2014, p. 57 How to cite?
URI: http://hdl.handle.net/10397/51031
Appears in Collections:Conference Paper

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