Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/49991
Title: Application of low-frequency noise measurement as a characterization tool for laser-assisted debonding of GaN-based devices
Authors: Chan, CP
Pilkuhn, M
Surya, C 
Issue Date: 2007
Source: Proceedings of the 19th International Conference on Noise and Fluctuations (ICNF' 2007), Tokyo, Japan, September 2007, p. 147-152 How to cite?
URI: http://hdl.handle.net/10397/49991
Appears in Collections:Conference Paper

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