Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/4996
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dc.contributorDepartment of Applied Physics-
dc.contributorMaterials Research Centre-
dc.creatorMak, CL-
dc.creatorLai, B-
dc.creatorWong, KH-
dc.creatorChoy, CL-
dc.creatorMo, D-
dc.creatorZhang, YL-
dc.date.accessioned2014-12-11T08:25:09Z-
dc.date.available2014-12-11T08:25:09Z-
dc.identifier.issn0021-8979-
dc.identifier.urihttp://hdl.handle.net/10397/4996-
dc.language.isoenen_US
dc.publisherAmerican Institute of Physicsen_US
dc.rights© 2001 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in C. L. Mak et al., J. Appl. Phys. 89, 4491 (2001) and may be found at http://link.aip.org/link/?jap/89/4491.en_US
dc.subjectPotassium compoundsen_US
dc.subjectSodium compoundsen_US
dc.subjectStrontium compoundsen_US
dc.subjectBarium compoundsen_US
dc.subjectFerroelectric thin filmsen_US
dc.subjectSol-gel processingen_US
dc.subjectRefractive indexen_US
dc.subjectSurface topographyen_US
dc.subjectAtomic force microscopyen_US
dc.subjectEllipsometryen_US
dc.subjectVisible spectraen_US
dc.titleSpectroellipsometric study of sol–gel derived potassium sodium strontium barium niobate filmsen_US
dc.typeJournal/Magazine Articleen_US
dc.description.otherinformationAuthor name used in this publication: C. L. Maken_US
dc.description.otherinformationAuthor name used in this publication: B. Laien_US
dc.description.otherinformationAuthor name used in this publication: K. H. Wongen_US
dc.description.otherinformationAuthor name used in this publication: C. L. Choyen_US
dc.identifier.spage4491-
dc.identifier.epage4496-
dc.identifier.volume89-
dc.identifier.issue8-
dc.identifier.doi10.1063/1.1355283-
dcterms.abstractSpectroscopic ellipsometry (SE) was used to characterize the sol–gel derived (K₀.₅Na₀.₅)₀.₄(Sr₀.₆Ba₀.₄)₀.₈Nb₂O₆(KNSBN) thin films as a function of sol concentration. In the analysis of the measured SE spectra, a modified double-layer Forouhi–Bloomer model was adopted to represent the optical properties of the KNSBN films. In this model, the films were assumed to consist of two layers—a bottom bulk KNSBN layer and a surface layer that composed of bulk KNSBN as well as void. Good agreement was obtained between the measured spectra and the model calculations in the chosen spectral region. Effective medium approximation theory was used to evaluate the effective refractive index for the surface layer. The results of SE have been correlated with atomic force microscopy measurements of surface roughness. Our analyses have shown that the surface layer had a lower refractive index than the bottom one. In addition, the refractive index and the surface roughness of the KNSBN films increase with the sol concentration.-
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationJournal of applied physics, 15 Apr. 2001, v. 89, no. 8, p. 4491-4496-
dcterms.isPartOfJournal of applied physics-
dcterms.issued2001-04-15-
dc.identifier.isiWOS:000167828500042-
dc.identifier.scopus2-s2.0-0035870889-
dc.identifier.eissn1089-7550-
dc.identifier.rosgroupidr03718-
dc.description.ros2000-2001 > Academic research: refereed > Publication in refereed journal-
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_IR/PIRAen_US
dc.description.pubStatusPublisheden_US
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