Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/49887
Title: 3-D simulation of twin boundary effect in single-grain silicon thin film transistors
Authors: Yan, F 
Issue Date: 2008
Source: MRS International Materials Research Conference, Chongqing, China, 9-12 June 2008, p. 179 How to cite?
URI: http://hdl.handle.net/10397/49887
Appears in Collections:Conference Paper

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