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Title: Testing system-on-chip by window comparator of cores' test output voltages
Authors: Ko, KY
Wong, MWT
Lee, YS
Issue Date: 2003
Source: Proceedings of the 4th International Workshop on RTL and High Level Testing (WRTLT' 2003), Xi'an, China, November 2003, p. 31-35
Appears in Collections:Conference Paper

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