Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/48583
Title: Study of test approach for IP cores applicable to SOC designs
Authors: Wong, MWT
Ko, KY
Lee, YS
Issue Date: 2001
Source: Proceedings of the 4th International Conference on ASIC (ASICON' 2001), Shanghai, China, October 2001, p. 612-615 How to cite?
URI: http://hdl.handle.net/10397/48583
Appears in Collections:Conference Paper

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