Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/48192
Title: Morphological study of plasma-etched polyamide materials by using scanning electron microscope
Authors: Yip, J
Chan, K
Sin, KM
Lau, KS
Issue Date: 2000
Source: Proceedings of the International Union of Materials Research Societies, 6th International Conference in Asia, City University, Hong Kong, Jul 2000 How to cite?
URI: http://hdl.handle.net/10397/48192
Appears in Collections:Conference Paper

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