Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/47895
Title: Measurement science and technology for ultra-precision freeform surfaces
Authors: Cheung, CF 
Kong, LB
Ren, MJ
Lee, WB 
To, S 
Issue Date: 2009
Source: The 3rd International Conference of Asian Society for Precision Engineering and Nanotechnology (ASPEN 2009), Kitakyushu, Japan, 11-13 Nov 2009, 2A2-6-2105-p (CD) How to cite?
URI: http://hdl.handle.net/10397/47895
Appears in Collections:Conference Paper

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