Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/46816
Title: Bayesian network for fault diagnosis
Authors: Lo, CH
Wong, YK 
Rad, AB
Issue Date: 2003
Source: European Control Conference, ECC 2003, Cambridge, UK, 1-4, September 2003 (CD-ROM) How to cite?
URI: http://hdl.handle.net/10397/46816
Appears in Collections:Conference Paper

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