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Title: An endurance-enhanced flash translation layer via reuse for NAND flash memory storage systems
Authors: Wang, YI
Liu, DUO
Qin, Z
Shao, Z 
Issue Date: 2011
Source: 14th Design, Automation and Test in Europe (DATE 2011), Grenoble, France, 14-18 March, 2011, p. 1-6 How to cite?
Appears in Collections:Conference Paper

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