Please use this identifier to cite or link to this item:
http://hdl.handle.net/10397/4625
DC Field | Value | Language |
---|---|---|
dc.contributor | Department of Electronic and Information Engineering | - |
dc.creator | Zheng, Y | - |
dc.creator | Wang, B | - |
dc.creator | Woo, CH | - |
dc.date.accessioned | 2014-12-11T08:24:40Z | - |
dc.date.available | 2014-12-11T08:24:40Z | - |
dc.identifier.issn | 0003-6951 | - |
dc.identifier.uri | http://hdl.handle.net/10397/4625 | - |
dc.language.iso | en | en_US |
dc.publisher | American Institute of Physics | en_US |
dc.rights | © 2006 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Y. Zheng, B. Wang & C. H. Woo, Appl. Phys. Lett. 88, 092903 (2006) and may be found at http://link.aip.org/link/?apl/88/092903 | en_US |
dc.subject | Ferroelectric thin films | en_US |
dc.subject | Dielectric polarisation | en_US |
dc.subject | Dislocations | en_US |
dc.subject | Finite difference methods | en_US |
dc.subject | Ginzburg-Landau theory | en_US |
dc.subject | Dielectric relaxation | en_US |
dc.title | Simulation of interface dislocations effect on polarization distribution of ferroelectric thin films | en_US |
dc.type | Journal/Magazine Article | en_US |
dc.description.otherinformation | Author name used in this publication: C. H. Woo | en_US |
dc.identifier.spage | 1 | - |
dc.identifier.epage | 3 | - |
dc.identifier.volume | 88 | - |
dc.identifier.issue | 9 | - |
dc.identifier.doi | 10.1063/1.2177365 | - |
dcterms.abstract | Effects of interfacial dislocations on the properties of ferroelectric thin films are investigated, using the dynamic Ginzburg–Landau equation. Our results confirm the existence of a dead layer near the film/substrate interface. Due to the combined effects of the dislocations and the near-surface eigenstrain relaxation, the ferroelectric properties of about one-third of the film volume suffers. | - |
dcterms.accessRights | open access | en_US |
dcterms.bibliographicCitation | Applied physics letters, 27 Feb. 2006, v. 88, no. 9, 092903, p. 1-3 | - |
dcterms.isPartOf | Applied physics letters | - |
dcterms.issued | 2006-02-27 | - |
dc.identifier.isi | WOS:000235736300064 | - |
dc.identifier.scopus | 2-s2.0-33644698949 | - |
dc.identifier.eissn | 1077-3118 | - |
dc.identifier.rosgroupid | r25620 | - |
dc.description.ros | 2005-2006 > Academic research: refereed > Publication in refereed journal | - |
dc.description.oa | Version of Record | en_US |
dc.identifier.FolderNumber | OA_IR/PIRA | en_US |
dc.description.pubStatus | Published | en_US |
Appears in Collections: | Journal/Magazine Article |
Files in This Item:
File | Description | Size | Format | |
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Zheng_Polarization_Ferroelectric_Films.pdf | 182.48 kB | Adobe PDF | View/Open |
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