Please use this identifier to cite or link to this item:
http://hdl.handle.net/10397/4602
DC Field | Value | Language |
---|---|---|
dc.contributor | Department of Applied Physics | - |
dc.contributor | Materials Research Centre | - |
dc.creator | Wang, DY | - |
dc.creator | Chan, HLW | - |
dc.creator | Choy, CL | - |
dc.date.accessioned | 2014-12-11T08:27:38Z | - |
dc.date.available | 2014-12-11T08:27:38Z | - |
dc.identifier.issn | 1559-128X | - |
dc.identifier.uri | http://hdl.handle.net/10397/4602 | - |
dc.language.iso | en | en_US |
dc.publisher | Optical Society of America | en_US |
dc.rights | © 2006 Optical Society of America. This paper was published in Applied Optics and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-45-9-1972. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law. | en_US |
dc.subject | Barium compounds | en_US |
dc.subject | Crystallography | en_US |
dc.subject | Epitaxial growth | en_US |
dc.subject | Optical properties | en_US |
dc.subject | Optical waveguides | en_US |
dc.subject | Prisms | en_US |
dc.title | Fabrication and characterization of epitaxial Ba₀.₇Sr₀.₃TiO₃ thin films for optical waveguide applications | en_US |
dc.type | Journal/Magazine Article | en_US |
dc.description.otherinformation | Author name used in this publication: Helen Lai Wa Chan | en_US |
dc.identifier.spage | 1972 | - |
dc.identifier.epage | 1978 | - |
dc.identifier.volume | 45 | - |
dc.identifier.issue | 9 | - |
dc.identifier.doi | 10.1364/AO.45.001972 | - |
dcterms.abstract | The optical properties of barium strontium titanate (Ba ₀.₇Sr₀.₃TiO₃; BST) thin films are described. The BST thin films were epitaxially grown upon MgO (001) substrates by pulsed laser deposition. The crystallographic properties of the BST thin films were examined by x-ray diffraction. The BST thin films were highly optically transparent in the visible region. The optical waveguide properties were characterized by a prism coupling technique. An inverse-WBK method was employed to determine the refractive-index profile along the thickness of the BST films. Optical losses were measured by a moving fiber method, and the optical losses were found to be 0.93 dB/cm for the TE₀ mode and 1.29 dB/cm for the TM₀ mode at 1550 nm. Electro-optic (E-O) properties were measured by a phase-modulation detection method at 632.8 nm, and the BST films exhibited a predominantly quadratic E-O effect with a quadratic E-O coefficient of 6.64 × 10⁻¹⁸ m²/V². | - |
dcterms.accessRights | open access | en_US |
dcterms.bibliographicCitation | Applied optics, 20 Mar. 2006, v. 45, no. 9, p. 1972-1978 | - |
dcterms.isPartOf | Applied optics | - |
dcterms.issued | 2006-03-20 | - |
dc.identifier.isi | WOS:000236376700011 | - |
dc.identifier.scopus | 2-s2.0-33645765137 | - |
dc.identifier.eissn | 2155-3165 | - |
dc.identifier.rosgroupid | r25745 | - |
dc.description.ros | 2005-2006 > Academic research: refereed > Publication in refereed journal | - |
dc.description.oa | Version of Record | en_US |
dc.identifier.FolderNumber | OA_IR/PIRA | en_US |
dc.description.pubStatus | Published | en_US |
Appears in Collections: | Journal/Magazine Article |
Files in This Item:
File | Description | Size | Format | |
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Wang_Fabrication_characterization_epitaxial.pdf | 456.51 kB | Adobe PDF | View/Open |
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