Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/45318
Title: Investigating perovskite-oxide based thin film bipolar resistance switching devices by thermal imaging
Authors: Luo, Z
Lau, HK
Chan, PKL
Leung, CW 
Issue Date: 2013
Source: Asia-Pacific Data Storage Conference 2013 (APDSC'13), Hualien, Taiwan, 20-22 November 2013, p. 1-2 How to cite?
URI: http://hdl.handle.net/10397/45318
Appears in Collections:Conference Paper

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