Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/45186
Title: Study on dip-coated ultra-thin low surface energy films by spectroscopic phase modulated ellipsometer
Authors: Wong, YW
Ip, G
Issue Date: 2000
Source: The Fifth Asian Symposium on Information Storage Technology (ASIST5), Hong Kong, China, 14-16 November 2000, p. 221-225 How to cite?
URI: http://hdl.handle.net/10397/45186
Appears in Collections:Conference Paper

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