Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/434
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dc.contributorDepartment of Applied Physics-
dc.contributorMaterials Research Centre-
dc.creatorSong, ZT-
dc.creatorChong, N-
dc.creatorChan, HLW-
dc.creatorChoy, CL-
dc.date.accessioned2014-12-11T08:27:43Z-
dc.date.available2014-12-11T08:27:43Z-
dc.identifier.issn0003-6951-
dc.identifier.urihttp://hdl.handle.net/10397/434-
dc.language.isoenen_US
dc.publisherAmerican Institute of Physicsen_US
dc.rights© 2001 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Z.T. Song et al. Appl. Phys. Lett. 79, 668 (2001) and may be found at http://link.aip.org/link/?apl/79/668en_US
dc.subjectLead compoundsen_US
dc.subjectLanthanum compoundsen_US
dc.subjectPiezoelectric thin filmsen_US
dc.subjectPyroelectricityen_US
dc.subjectLiquid phase deposited coatingsen_US
dc.subjectDielectric polarisationen_US
dc.subjectDielectric hysteresisen_US
dc.subjectPermittivityen_US
dc.subjectDielectric lossesen_US
dc.subjectLeakage currentsen_US
dc.subjectX-ray diffractionen_US
dc.subjectScanning electron microscopyen_US
dc.subjectPiezoceramicsen_US
dc.subjectFerroelectric thin filmsen_US
dc.titleElectrical and pyroelectric properties of in-plane polarized lead lanthanum titanate thin filmen_US
dc.typeJournal/Magazine Articleen_US
dc.description.otherinformationAuthor name used in this publication: N. Chongen_US
dc.identifier.spage668-
dc.identifier.epage670-
dc.identifier.volume79-
dc.identifier.issue5-
dcterms.abstractPb[sub 0.9]La[sub 0.1]Ti[sub 0.975]O₃ (PLT10) thin films were deposited on SiO₂ /Si(100) substrates coated with a ZrO₂ buffer layer. Studies by x-ray diffraction and scanning electron microscopy reveal that the ZrO₂ film consists of both tetragonal and monoclinic phases, with the tetragonal phase being the dominant one. The PLT10 film has a perovskite structure and the grains in the film have a rather uniform size of about 50 nm. By using interdigital transducer (IDT) electrodes the in-plane electrical properties, hysteresis loop, and pyroelectric coefficient of the PLT10 film were measured. The dielectric constant and loss factor vary only slightly with frequency in the range 10³-10[sup 6] Hz, with the loss factor being less than 0.01 over the entire range. The leakage current density is lower than 2x10[sup -8]A/cm² at a bias field of 5 kV/cm. The remnant polarization and coercive field are 12.6 µC/cm² and 9.93 kV/cm, respectively. The film exhibits a reasonably high pyroelectric coefficient (95 µC/m²K) after it has been poled by applying 120 V ac at 0.1 Hz across the IDT electrodes.-
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationApplied physics letters, 30 July 2001, v. 79, no. 5, p. 668-670-
dcterms.isPartOfApplied physics letters-
dcterms.issued2001-07-30-
dc.identifier.isiWOS:000170015900038-
dc.identifier.scopus2-s2.0-0040622141-
dc.identifier.eissn1077-3118-
dc.identifier.rosgroupidr06882-
dc.description.ros2001-2002 > Academic research: refereed > Publication in refereed journal-
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_IR/PIRAen_US
dc.description.pubStatusPublisheden_US
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