Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/4213
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dc.contributorDepartment of Applied Physics-
dc.creatorWong, CK-
dc.creatorShin, FG-
dc.date.accessioned2014-12-11T08:27:17Z-
dc.date.available2014-12-11T08:27:17Z-
dc.identifier.issn0003-6951-
dc.identifier.urihttp://hdl.handle.net/10397/4213-
dc.language.isoenen_US
dc.publisherAmerican Institute of Physicsen_US
dc.rights© 2005 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in C. K. Wong & F. G. Shin, Appl. Phys. Lett. 86, 042901 (2005) and may be found at http://apl.aip.org/resource/1/applab/v86/i4/p042901_s1en_US
dc.subjectFerroelectric thin filmsen_US
dc.subjectPermittivityen_US
dc.subjectDielectric hysteresisen_US
dc.subjectDielectric polarisationen_US
dc.subjectDeformationen_US
dc.subjectElectrical conductivityen_US
dc.titleA possible mechanism of anomalous shift and asymmetric hysteresis behavior of ferroelectric thin filmsen_US
dc.typeJournal/Magazine Articleen_US
dc.description.otherinformationAuthor name used in this publication: F. G. Shinen_US
dc.identifier.spage1-
dc.identifier.epage3-
dc.identifier.volume86-
dc.identifier.issue4-
dc.identifier.doi10.1063/1.1853520-
dcterms.abstractWe studied theoretically the hysteresis behavior of ferroelectric thin films. The anomalous ferroelectric response is discussed by use of a bilayer model. Electrical conductivities of the films have been taken into account. To model the effects of the inhomogeneity of polarization and permittivity across the interface, the film is assumed to possess a secondary dielectric∕ferroelectric phase (a dead or passive layer) with asymmetric conductivity. This configuration is found to produce large shifting (along the field axis) and deformation of the measured hysteresis loop. This is a manifestation of the asymmetric conductivity of the material. Theoretical calculation based on this model shows that the observed phenomena of shifted and skewed hysteresis loop in ferroelectric thin films can be explained in this way.-
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationApplied physics letters, 24 Jan. 2005, v. 86, no. 4, 042901, p.1-3-
dcterms.isPartOfApplied physics letters-
dcterms.issued2005-01-24-
dc.identifier.isiWOS:000226761400053-
dc.identifier.scopus2-s2.0-13644282506-
dc.identifier.eissn1077-3118-
dc.identifier.rosgroupidr25103-
dc.description.ros2004-2005 > Academic research: refereed > Publication in refereed journal-
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_IR/PIRAen_US
dc.description.pubStatusPublisheden_US
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