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Title: Exploring the relationship between CRTN and CPX noise measuring methods
Authors: Mak, KL
Lee, SH
Hung, WT 
Ho, KY
Kam, E
Issue Date: 2010
Source: Proceedings of the 15th HKSTS International Conference, Hong Kong, 11-14 December 2010, p. 781-788 How to cite?
Appears in Collections:Conference Paper

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