Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/40784
Title: Effect of preparation on the growth mode and structure in laser MBE grown multilayer of SrTiO3 and YBa2Cu3Oy
Authors: Wu, ZP
Li, JL
Hao, JH 
Keywords: Lasers
Molecular beam epitaxy
Multilayers
Interfaces
Atomic force microscope
Diffraction
Electrons
Thin films
Issue Date: 2007
Publisher: SPIE-International Society for Optical Engineering
Source: Proceedings of SPIE : the International Society for Optical Engineering, 2007, v. 6643, 66430L How to cite?
Journal: Proceedings of SPIE : the International Society for Optical Engineering 
Abstract: Multilayer of SrTiO3(STO)-YBa2Cu3O7-δ(YBCO) was fabricated by laser molecular beam epitaxy (LMBE). The properties of multilayer in terms of growth modes, strain and interface structures were characterized by the in situ reflective high energy electron diffraction (RHEED) pattern, and ex situ measurements, such as atomic force microscope (AFM). By controlling growth and processing conditions, we observed a change of different growth modes of thin films. Furthermore, we also demonstrate a strong dependence of growth modes in YBCO films on the growth fashion of STO films, which could be explained in terms of the stress effect at the interface. The dependence of interface stress on thickness and growth condition was determined with AFM. These results provide an understanding and manipulating growth mechanism of the films.
Description: Conference on Physical Chemistry of Interfaces and Nanomaterials VI, San Diego, USA, 26-30 August 2007
URI: http://hdl.handle.net/10397/40784
ISSN: 0277-786X
EISSN: 1996-756X
DOI: 10.1117/12.731080
Appears in Collections:Conference Paper

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