Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/39214
Title: Charge storage characteristics of Ag nanocrystals embedded HfAlOx films on compressively strained Si83Ge17/Si substrate
Authors: Zhou, GD
Zhang, SY
Liu, ZJ
Dai, JY 
Qiu, XY
Issue Date: 2012
Source: International Symposium on Integrated Functionalities (ISIF 2012), Hong Kong, China, 18-21 June 2012, p. 22-23 How to cite?
URI: http://hdl.handle.net/10397/39214
Appears in Collections:Conference Paper

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