Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/38941
Title: In-plane dielectric characterization of PbZr0.3Ti0.7O3 thin film
Authors: Wang, DY
Cheng, YL
Wang, Y 
Chan, HLW 
Choy, CL 
Issue Date: 2005
Source: The 17th International Symposium on Integrated Ferroelectrics (ISIF 2005), Shanghai, China, 17-20 April 2005, p. 11-31-P How to cite?
URI: http://hdl.handle.net/10397/38941
Appears in Collections:Conference Paper

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