Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/38935
Title: Simulation of stress-induced enhanced dielectric permittivity in ferroelectric superlattice
Authors: Lo, VC
Jiang, W
Issue Date: 2005
Source: The 17th International Symposium on Integrated Ferroelectrics (ISIF 2005), Shanghai, China, 17-20 April 2005, p. 10-18-P How to cite?
URI: http://hdl.handle.net/10397/38935
Appears in Collections:Conference Paper

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