Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/35038
Title: Ferroelectric and dielectric properties of sol–gel derived BaxSr1−xTiO3 thin films
Authors: Adikary, SU
Chan, HLW 
Issue Date: 2003
Source: Thin solid films, 2003, v. 424, no. 1, p. 70-74
Abstract: Ferroelectric thin films of Ba0.7Sr0.3TiO3, Ba0.8Sr0.2TiO3, Ba0.9Sr0.1TiO3 and BaTiO3 were fabricated by a modified sol–gel technique on Pt/Ti/SiO2/Si substrates. All the compositions crystallized in perovskite structure and consist of well-defined grains. As the value of x increases grain size of the BaxSr1−xTiO3 thin films increases while the dielectric permittivity decreases. Ba0.7Sr0.3TiO3 composition possesses the highest dielectric permittivity of 748 (at 100 kHz). Hysteresis loops measured at room temperature for all compositions showed that BaTiO3 has the largest remnant polarization of 4.8 μC/cm2. The dielectric and ferroelectric properties of the sol–gel derived BaxSr1−xTiO3 thin films are strongly dependent on the Sr content and the grain size.
Keywords: Barium strontium titanate
Dielectric properties
Grain size
Publisher: Elsevier
Journal: Thin solid films 
ISSN: 0040-6090
EISSN: 1879-2731
DOI: 10.1016/S0040-6090(02)00918-5
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