Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/34903
Title: Dynamic hysteresis of ferroelectric Pb(Zr0.52Ti0.48)O3 thin films
Authors: Liu, JM
Yu, LC
Yuan, GL
Yang, Y
Chan, HLW 
Liu, ZG
Keywords: Ferroelectric thin films
Dynamic hysteresis
Issue Date: 2003
Publisher: Elsevier
Source: Microelectronic engineering, 2003, v. 66, no. 1-4, p. 798-805 How to cite?
Journal: Microelectronic engineering 
Abstract: Ferroelectric Pb(Zr0.52Ti0.48)O3 (PZT) thin films sandwiched by YBa2Cu3O7 (YBCO) electrodes on (001) SrTiO3 wafers are fabricated by pulsed laser deposition. The dynamic hysteresis response of the film capacitors to the periodic time-varying electrical field E(t) of different amplitude E0 (0–45 kV/cm) and frequency f (f=10−2–105 Hz) is measured. We study in detail the evolution of the hysteresis pattern and demonstrate the significant influence of both the amplitude and frequency of the electrical field on the pattern and area of the hysteresis.
URI: http://hdl.handle.net/10397/34903
ISSN: 0167-9317
EISSN: 1873-5568
DOI: 10.1016/S0167-9317(02)01002-X
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