Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/34878
Title: Piezoelectric coefficient measurement of piezoelectric thin films : an overview
Authors: Liu, JM
Pan, B
Chan, HLW 
Zhu, SN
Zhu, YY
Liu, ZG
Keywords: Piezoelectric coefficient
Piezoelectric thin films
Issue Date: 2002
Publisher: Elsevier
Source: Materials chemistry and physics, 2002, v. 75, no. 1-3, p. 12-18 How to cite?
Journal: Materials chemistry and physics 
Abstract: An overview on the state-of-art piezoelectric measurements of thin films is given. The principles and advantages/disadvantages of the conventional techniques are discussed for piezoelectric applications. Concerning a direct measurement of piezoelectric coefficient and taking into account of 1.0–100.0 μm in film thickness, a displacement of 0.1 nm cannot be reliably detected by utilizing the reverse piezoelectric effect, unless the probe’s resolution reaches up to 10−3 nm. The sensitivity of charge-integrator cannot be worse than ∼0.1 nC, typically. Such a high resolution in terms of displacement and charge may not be always reachable if the measurement is not carefully calibrated and manipulated. New demands on the techniques have been placed and a more careful selection of the techniques to be used is required.
URI: http://hdl.handle.net/10397/34878
ISSN: 0254-0584
EISSN: 1879-3312
DOI: 10.1016/S0254-0584(02)00023-8
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