Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/34663
Title: Microstructural and morphological evolutions in compositionally-graded (Ba1-xSrx )TiO3 thin films and related dielectric properties
Authors: Zhu, XH
Chan, HLW 
Choy, CL 
Wong, KH
Keywords: Compositionally-graded films
(Ba1−xSrx)TiO3
Structural and morphological evolutions
Dielectric properties
Issue Date: 2002
Publisher: Taylor & Francis
Source: Integrated ferroelectrics, 2002, v. 45, no. 1, p. 131-140 How to cite?
Journal: Integrated ferroelectrics
Abstract: Compositionally-graded (Ba 1 m x Sr x )TiO 3 (BST) (0.0 h 2 h 0.25) thin films consisting of successive layers with increasing Sr/Ba ratios have been layer-by-layer grown on Pt(111)/Ti/SiO 2 /Si(100) substrates by pulsed-laser deposition. Their microstructural and morphological evolutions with increasing film thickness were investigated by x-ray diffraction (XRD) and scanning electron microscope (SEM). XRD results show that their preferred textures evolve in the sequence of [(100)+(110)] M (110) M (100) as the film thickness increases. The corresponding surface grain morphology evolves from compact spherical to elongated, and finally turns to irregular shapes. The related driving force for the orientation development was presumably changed from the minimization of surface energy to the minimization of energy loss per unit area as the film thickness is increased. The measured dielectric properties of the graded films are closely related to the changes of crystallographic orientations, and their relationships are also discussed.
URI: http://hdl.handle.net/10397/34663
ISSN: 1058-4587 (print)
1607-8489 (online)
DOI: 10.1080/10584580215343
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