Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/34623
Title: Enhancing the fault diagnosis of linear analog circuit steady-state DC testing through the analysis of equivalent faults
Authors: Worsman, M
Wong, MW
Lee, YS
Issue Date: 2003
Publisher: Institute of Electrical and Electronics Engineers
Source: IEEE transactions on circuits and systems. I, Fundamental theory and applications, 2003, v. 50, no. 7, p. 932-936 How to cite?
Journal: IEEE transactions on circuits and systems. I, Fundamental theory and applications 
Abstract: Presented is a study of fault equivalence in steady-state dc linear analog circuits. Equivalent fault relationships attributable to node isolation or equivalence in the driving-point and/or transfer characteristics of one-port network are shown to prevent effective fault diagnosis in a number of basic analog circuits. The analysis of these conditions using graph and transformation theorems is demonstrated to provide the basis for a more systematic approach to improving fault diagnosis.
URI: http://hdl.handle.net/10397/34623
ISSN: 1057-7122
DOI: 10.1109/TCSI.2003.813957
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