Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/34445
Title: Characteristics of BaxSr1–xTiO3 thin films grown by pulsed laser ablation of rotating split targets of BaTiO3 and SrTiO3
Authors: Ruckenbauer, V
Hau, FF
Lu, SG
Yeung, KM
Mak, CL 
Wong, KH
Issue Date: 2004
Publisher: Springer-Verlag
Source: Applied physics A : materials science & processing, 2004, v. 78, no. 7, p. 1049-1052 How to cite?
Journal: Applied physics A : materials science & processing
Abstract: We have grown heterostructures of BaxSr1-xTiO3(BST)/La0.7Sr0.3MnO3(LSMO) on LaAlO3(LAO) substrates by the pulsed laser deposition method. BST films with x=0.2,0.5,0.7 and 0.8 have been prepared using a novel rotating split-target arrangement. The lattice constant of the BST films is found to vary linearly with Ba/Sr ratio. An excellent cube-on-cube epitaxial relationship of (100)BST
(100)LSMO
(100)LAO has also been obtained. Scanning electron microscopy studies have revealed smooth and crack-free BST films with a uniform grain size of about 100 nm. Dielectric measurements, made with patterned Au top electrodes and conducting LSMO bottom layers, have shown a maximum permittivity of approximately 280 at 5 kHz in BST films with x=0.7. P–E loop analyses of the Ba0.7Sr0.3TiO3 and Ba0.8Sr0.2TiO3 films have yielded remnant polarization values of 1.66 and 1.81μC/cm2, respectively.
URI: http://hdl.handle.net/10397/34445
ISSN: 0947-8396 (print)
1432-0630 (online)
DOI: 10.1007/s00339-003-2154-0
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