Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/34371
Title: Improving fault diagnostic resolution of an oscillation-based test methodology scheme for the threshold detector circuit
Authors: Ko, KY
Gorla, NS
Wong, MWT
Lee, YS
Issue Date: 2001
Publisher: Taylor & Francis Ltd
Source: International journal of electronics, 2001, v. 88, no. 2, p. 175-187 How to cite?
Journal: International Journal of Electronics 
Abstract: This paper presents a simple design for test, an oscillation-based test methodology (OTM) scheme for a threshold detector circuit which is commonly used in telephone tone ringer applications. The method proposed is based on a three-phase testing procedure. In phase one, OTM is employed to achieve high fault coverage without the need for test generation. This is followed by the measurement of the power supply current in phase two to identify and locate faults. In phase three, node voltage measurements are utilized to further improve the fault diagnostic resolution.
URI: http://hdl.handle.net/10397/34371
ISSN: 0020-7217
DOI: 10.1080/00207210010006065
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