Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/34288
Title: Dynamic hysteresis stability of ferroelectric Pb(Zr0.52Ti 0.48)O3 thin films
Authors: Liu, JM
Xiao, Q
Liu, ZG
Chan, HLW 
Ming, NB
Keywords: Dynamic hysteresis
Ferroelectric thin films
Hysteresis scaling
Issue Date: 2003
Publisher: Elsevier
Source: Materials chemistry and physics, 2003, v. 82, no. 3, p. 733-741 How to cite?
Journal: Materials chemistry and physics 
Abstract: Ferroelectric Pb(Zr0.52Ti0.48)O3 (PZT) thin films sandwiched by YBa2Cu3O7 (YBCO) electrodes on (0 0 1) SrTiO3 wafers are prepared by pulsed laser deposition. The dynamic hysteresis response of the films to the periodic time-varying electrical field E(t) of different amplitude E0 (0-45kVcm-1) and frequency f (f = 10-2 to 10 5Hz) is measured. We study in detail the evolution and stability of the hysteresis pattern. A stability diagram for the dynamic hysteresis of PZT films is developed and an empirical scaling relationship covering the whole frequency range is proposed. Finally, we develop a Monte-Carlo (MC) algorithm based on the planar X-Y model to simulate the dynamic hysteresis in multi-domain spin systems and a qualitative consistency between the simulated dynamic behaviors and measured ones is established.
URI: http://hdl.handle.net/10397/34288
ISSN: 0254-0584
EISSN: 1879-3312
DOI: 10.1016/S0254-0584(03)00360-2
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