Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/33472
Title: H2O-induced degradation in TiO2-based ceramic capacitors
Authors: Wang, XX
Chen, WP
Chan, HLW 
Choy, CL 
Keywords: Electrolysis
H2O-induced degradation
TiO2-based ceramic capacitors
Issue Date: 2003
Publisher: North-Holland
Source: Materials letters, 2003, v. 57, no. 28, p. 4351-4355 How to cite?
Journal: Materials letters 
Abstract: H2O-induced degradation in TiO2-based ceramic capacitors (rutile-based ceramic capacitor) was studied by means of the electrolysis of water. In the test, the ceramic capacitors were placed in a 0. 01 M NaOH solution and a small dc voltage was applied to evolve hydrogen onto their silver electrodes. The samples treated by electrolysis of water showed obvious degradation as their permittivity decreased and their dielectric loss increased significantly. I-V measurements indicated that the resistance decreased greatly in the degraded samples. The decrease in resistance could be ascribed to the generation of charge carriers due to the reduction reaction of atomic hydrogen from the electrolysis of water. These results suggested that the reduction reaction of atomic hydrogen at ambient temperature was a cause of the degradation for the rutile ceramic capacitors.
URI: http://hdl.handle.net/10397/33472
ISSN: 0167-577X
EISSN: 1873-4979
DOI: 10.1016/S0167-577X(03)00275-1
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