Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/33389
Title: Preparation and characterization of compositionally graded epitaxial barium strontium titanate thin films via scanning probe microscopy
Authors: Lu, SG
Chen, H
Mak, CL 
Wong, KH
Chan, HLW 
Choy, CL 
Xu, JJ
Shi, SQ 
Keywords: Barium strontium titanate
Scanning force microscopy
Thin film
Issue Date: 2005
Publisher: Scientific.Net
Source: Key engineering materials, 2005, v. 280-283, no. II, p. 1903-1908 How to cite?
Journal: Key engineering materials 
Abstract: Epitaxially graded barium strontium titanate (BaxSr 1-x)TiO3 (x = 0.75,0.8,0.9,1.0, abbreviated as BST75, BST80, BST90 and BTO respectively) thin films were fabricated by pulsed laser deposition method on the (La0.7Sr0.3)MnO3 (LSMO)/LaAlO3 (LAO) single crystal substrate. Scanning probe microscopy with a contact mode was used to characterize the temperature dependence of polarization from room temperature to 140°C. Results indicated that the piezo-response signal of the BST graded films had an obvious change with temperature, and that the graded structures had a flatter temperature dependence of permittivity. Furthermore, the contrasts of the SPM images were lower for the ferroelectric - paraelectric (F-P) phase transition temperatures of BST 75, BST 80, and BST90, but higher for the F-P transition temperature of BTO.
URI: http://hdl.handle.net/10397/33389
ISSN: 1013-9826
EISSN: 1662-9795
Appears in Collections:Conference Paper

Access
View full-text via PolyU eLinks SFX Query
Show full item record

Page view(s)

43
Last Week
2
Last month
Checked on Sep 18, 2017

Google ScholarTM

Check



Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.