Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/33072
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dc.contributorDepartment of Electronic and Information Engineering-
dc.creatorHuang, JA-
dc.creatorZhao, YQ-
dc.creatorZhang, XJ-
dc.creatorLuo, LB-
dc.creatorLiu, YK-
dc.creatorZapien, JA-
dc.creatorSurya, C-
dc.creatorLee, ST-
dc.date.accessioned2015-07-14T01:28:20Z-
dc.date.available2015-07-14T01:28:20Z-
dc.identifier.issn0003-6951-
dc.identifier.urihttp://hdl.handle.net/10397/33072-
dc.language.isoenen_US
dc.publisherAmerican Institute of Physicsen_US
dc.rights© 2011 American Institute of Physics.en_US
dc.rightsThis article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in J. A. Huang et al., Appl. Phys. Lett. 98, 183108 (2011) and may be found at https://dx.doi.org/10.1063/1.3584871en_US
dc.titleEnhanced Raman scattering from vertical silicon nanowires arrayen_US
dc.typeJournal/Magazine Articleen_US
dc.identifier.volume98-
dc.identifier.issue18-
dc.identifier.doi10.1063/1.3584871-
dcterms.abstractWe fabricated ordered hexagonal-packed vertical silicon nanowire (SiNW) arrays with varying diameters of 450-900 nm and varying lengths of 0.54-7.3 μm, and studied their Raman enhancement properties. We found the Raman enhancement per unit volume (REV) increased with decreasing wire diameters and oscillated with wire length, and the REV of seven 450-nm-diameter, 3-μm -long SiNWs was about twice that of a single SiNW having the same size. The differences were attributed to the vertical finite-length cylinder structures of the SiNW array, as supported by finite-difference-time-domain simulation results based on the helical resonant surface wave model.-
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationApplied physics letters, 2011, v. 98, no. 18, 183108, p. 183108-1-183108-3-
dcterms.isPartOfApplied physics letters-
dcterms.issued2011-
dc.identifier.isiWOS:000290392300052-
dc.identifier.scopus2-s2.0-79957457579-
dc.identifier.eissn1077-3118-
dc.identifier.rosgroupidr58595-
dc.description.ros2011-2012 > Academic research: refereed > Publication in refereed journal-
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_IR/PIRAen_US
dc.description.pubStatusPublisheden_US
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