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Title: DFT for improving the testability of parametric resistor faults in a strain gauge measurement circuit
Authors: Wong, MWT
Keywords: Bridge circuits
Circuit testing
Design for testability
Fault diagnosis
Instrumentation amplifiers
Strain gauges
Strain measurement
Issue Date: 2003
Publisher: IEEE
Source: IEEE TENCON 2003 : Conference on Convergent Technologies for the Asia-Pacific Region : October 15-17, 2003, Bangalore, India, v. 1, p. 488-492 How to cite?
Abstract: This paper describes how equivalent fault analysis is used to formulate a DFT scheme for a strain gauge measurement circuit, consisting of a Wheatstone bridge and amplifier. The derivation of fault equivalence relationships benefit from the simplification of analyzing each subcircuit in isolation from the system. The error introduced by ignoring loading and coupling effects is shown to be small for the fault ranges considered. The DFT solution developed combined individual solutions to subcircuit fault equivalence. Experimental results obtained demonstrate the effectiveness and validity of the approach.
ISBN: 0-7803-8162-9
DOI: 10.1109/TENCON.2003.1273370
Appears in Collections:Conference Paper

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