Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/32546
Title: Design and implementation of self-testable full range window comparator
Authors: Wong, MWT
Zhang, YB
Keywords: Built-in self test
Comparators (circuits)
Fault diagnosis
Fault tolerance
Integrated circuit design
Mixed analogue-digital integrated circuits
Network analysis
System-on-chip
Issue Date: 2004
Publisher: IEEE
Source: 13th Asian Test Symposium, 2004, November 2004, Kenting, Taiwan, p. 314-318 How to cite?
Abstract: This paper presents a new approach to implement a full range window comparator (FRWC) with self-testing capability. Detailed analysis of the proposed comparator circuit has shown that the overall design not only can achieve high fault coverage in the FRWC but also can detect or tolerate single fault in the self testing circuitry used.
URI: http://hdl.handle.net/10397/32546
ISBN: 0-7695-2235-1
ISSN: 1081-7735
DOI: 10.1109/ATS.2004.35
Appears in Collections:Conference Paper

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