Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/32385
Title: The grain size effect of Pb(Zr0.3Ti0.7)O3 thin films
Authors: Yan, F
Bao, P
Chan, HLW 
Choy, CL 
Wang, Y
Keywords: Dielectric properties
Domain wall
Ferroelectric properties
Interfaces
Issue Date: 2002
Publisher: Elsevier
Source: Thin solid films, 2002, v. 406, no. 1-2, p. 282-285 How to cite?
Journal: Thin solid films 
Abstract: The grain size strongly influences the fatigue properties of Pb(Zr0.3Ti0.7)O3 (PZT) thin films with platinum (Pt) electrodes. A film with smaller grain size has better fatigue properties. It was assumed that fatigue is mainly due to the pinning of domain walls by space charge or charged point defects near Pt electrodes. Therefore, the film with a lower fraction of the grains touching Pt electrodes has better fatigue properties. The permittivity of the thin film decreases with the decrease in grain size. This may be due to the decrease of mobility of domain walls with the decrease of grain size.
URI: http://hdl.handle.net/10397/32385
ISSN: 0040-6090
EISSN: 1879-2731
DOI: 10.1016/S0040-6090(01)01745-X
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