Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/31984
Title: A state-based predictive approach for leakage reduction of functional units
Authors: Pan, L
Guo, M
Yang, Y
Wang, M
Shao, Z 
Issue Date: 2008
Source: IEEE/IFIP International Conference on Embedded and Ubiquitous Computing, 2008 : EUC '08, 17-20 December 2008, Shanghai, p. 52-58
Abstract: As MOSFETs (metal-oxide-semiconductor field effect transistor) dimensions enter the sub-micrometer region, reducing leakage power becomes a significant issue of VLSI industry. In this paper, we propose a novel prediction approach to predict idleness of functional units for leakage energy management. Using a state-based predictor, historical utilization information of functional units is exploited to adjust the state of the predictor so as to enhance the accuracy of prediction. We implement our approach based on SimpleScalar and conduct experiments with a suite of fourteen benchmarks from Trimaran. The experimental results show that our approach achieves the better results compared with the previous work.
Keywords: Dual Thresholds
Leakage Energy Management
Power-Gating
State-based Predictor
Publisher: IEEE
ISBN: 978-0-7695-3492-3
DOI: 10.1109/EUC.2008.175
Appears in Collections:Conference Paper

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