Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/31928
Title: Preparation and characterizations of Ba(Zr,Ti)O3/(Ba,Sr)TiO 3 heterostructures grown on (LaAlO3)0.3(Sr 2AlTaO6)0.35 single crystal substrates by pulsed laser deposition
Authors: Chan, NY
Gao, GY
Wang, Y 
Chan, HLW 
Keywords: (Ba,Sr)(Zr,Ti)O3
Pulsed laser deposition
Relative permittivity
Thin films
Issue Date: 2010
Source: Thin solid films, 2010, v. 518, no. 24 SUPPL., p. e82-e84 How to cite?
Journal: Thin Solid Films 
Abstract: Epitaxial perovskite (Ba0.7Sr0.3)TiO3 (BST), Ba(Zr0.2Ti0.8)O3 (BZT), Ba(Zr 0.2Ti0.8)O3/(Ba0.7Sr 0.3)TiO3(BZT/BST) and Ba0.85Sr 0.15Zr0.1Ti0.9O3 (BSZT) thin films were grown on (LaAlO3)0.3(Sr2AlTaO 6)0.35 (LSAT)[001]single crystal substrate coated with conducting oxide LaNiO3(LNO) by pulsed laser deposition. X-ray diffraction, atomic force microscopy and electrical measurements were used to characterize the thin films. The θ-2θ linear scan indicated that the thin films with LNO layer show (001) orientations perpendicular to the substrate. Smooth and dense surface with grain size of 30 nm-80 nm were observed. The relative permittivity of the BST, BZT/BST, BZT and BSZT thin films are 1101, 799, 584 and 1784 respectively at 10 kHz. The tunability of the thin films are 39%, 32%, 44% and 60%. The results show that BSZT film has the highest tunability.
URI: http://hdl.handle.net/10397/31928
ISSN: 0040-6090
DOI: 10.1016/j.tsf.2010.03.088
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