Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/31697
Title: Polarization fatigue in ferroelectric thin films
Authors: Wang, Y
Wong, KH
Wu, WB
Issue Date: 2002
Source: Chinese physics letters, 2002, v. 19, no. 4, p. 566-568
Abstract: The fatigue problem in ferroelectric thin films is investigated based on the switched charge per unit area versus switching cycles. The temperature, dielectric permittivity, voltage bias, frequency and defect valence dependent switching polarization properties are calculated quantitatively with an extended Dawber-Scott model. The results are in agreement with the recent experiments.
Publisher: Chinese Physical Society
Journal: Chinese physics letters 
ISSN: 0256-307X
EISSN: 1741-3540
DOI: 10.1088/0256-307X/19/4/336
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