Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/31594
Title: Issues related to the formulation of DFT solution for analog circuit test using equivalent fault analysis
Authors: Wong, MWT
Keywords: Circuit testing
Design for testability
Fault diagnosis
Issue Date: 2003
Publisher: IEEE
Source: 12th Asian Test Symposium, 2003 : ATS 2003, 16-19 November 2003, p. 120-123 How to cite?
Abstract: This paper identifies a few important points at which the application of equivalent fault analysis becomes the preferred choice in formulating a DFT solution for analog circuit test. These issues are important in that the test and/or design engineer should be aware of them in order to come up with effective test solutions to enhance fault diagnosis.
URI: http://hdl.handle.net/10397/31594
ISBN: 0-7695-1951-2
ISSN: 1081-7735
DOI: 10.1109/ATS.2003.1250795
Appears in Collections:Conference Paper

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